NV-based quantum magnetometry revolutionizes microelectronics and material analysis by enabling non-invasive, room-temperature magnetic imaging with unprecedented sensitivity and resolution. Widefield NV sensors allow rapid inspection of large circuit areas, while scanning NV probes deliver nanoscale detail for defect localization and stress analysis. This technology supports real-time quality assurance for integrated circuits, battery systems, and advanced materials under operational conditions—without cryogenic cooling or bulky shielding. By combining high spatial resolution (down to tens of nanometers) with pT-level sensitivity, NV magnetometry provides actionable insights for process optimization, failure analysis, and predictive maintenance in industrial environments.
